On Demand Webinar: The Surface Analysis Toolbox

This on-demand webinar by Thermo Fisher Scientific presents a deep dive into the integration of multiple analytical techniques — including XPS, ISS, REELS, AES, UPS, and Raman spectroscopy — to achieve a complete understanding of material surfaces. It demonstrates how combining these tools within a single workflow enhances precision, depth, and clarity in nanoscale material characterization.

Webinar Details

About the Webinar

In modern surface science and nanotechnology, no single analytical method provides a full picture of complex materials. X-ray Photoelectron Spectroscopy (XPS) remains the foundation for elemental and chemical surface characterization, but complementary techniques are essential to reveal deeper insights into composition, bonding, and morphology.

In this on-demand session titled “The Surface Analysis Toolbox,” Thermo Fisher Scientific experts present how integrating multiple advanced surface techniques within a single workflow — using instruments like the Thermo Scientific™ Nexsa™ Surface Analysis System and ESCALAB™ Xi+ XPS Microprobe — enables unparalleled precision in nanoscale research.

Techniques Covered

The webinar provides a foundational overview and practical applications of the following complementary tools:

1. X-ray Photoelectron Spectroscopy (XPS) – The core method for identifying elemental composition and chemical states.

2. Ion Scattering Spectroscopy (ISS) – For probing the outermost atomic layers with high surface sensitivity.

3. Reflected Electron Energy Loss Spectroscopy (REELS) – To study electronic structures and surface plasmons.

4. Auger Electron Spectroscopy (AES) – To analyze surface composition and fine chemical shifts.

5. UV Photoelectron Spectroscopy (UPS) – Ideal for investigating valence bands and work functions.

6. Raman Spectroscopy – For structural and molecular fingerprinting of materials, particularly organic and 2D systems.

Key Learning Outcomes

Participants will:

• Understand how to combine multiple spectroscopic and electron-based techniques for multi-dimensional surface analysis.

• Learn how co-located measurement systems enhance reproducibility and minimize sample damage.

• See real examples of how integrated workflows improve the accuracy of nanomaterial and thin-film analysis.

• Gain insights into multi-technique data correlation for materials innovation.

Why This Matters for Nanotechnology Researchers

At the nanoscale, even subtle surface variations can dramatically alter optical, electrical, and catalytic properties. By combining XPS with complementary methods like Raman and UPS, researchers can capture a comprehensive chemical and structural fingerprint of nanomaterials.

This integrated workflow enables breakthroughs in:

• Semiconductor surface modification

• Catalysis and corrosion studies

• Thin film and coating optimization

• 2D material and quantum device fabrication

Featured Instruments

• Thermo Scientific™ Nexsa™ Surface Analysis System

• Thermo Scientific™ ESCALAB™ Xi+ XPS Microprobe

Both systems are designed for multi-technique integration, allowing seamless transitions between XPS, ISS, REELS, UPS, and Raman measurements — all within a single platform.

Webinar Access

🕒 Run time: 60 minutes
🌐 Format: On-demand
🎓 Access: Watch the Webinar on Thermo Fisher Scientific’s Website

Reference Links

• Official Thermo Fisher Scientific Webinar Page

• Thermo Scientific Nexsa Surface Analysis System

• Thermo Scientific ESCALAB Xi+ XPS Microprobe

Disclaimer

All event details and content are provided by Thermo Fisher Scientific. Availability may vary by region. Please refer to the official page for updates and registration.

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