Home Vacancies PhD Position on Multilayer Growth Optimization by Hybrid X-Ray Metrology (MOXY) – University of Twente, Netherlands

PhD Position on Multilayer Growth Optimization by Hybrid X-Ray Metrology (MOXY) – University of Twente, Netherlands

Advanced nanometer-thin film characterization for optical and semiconductor applications

by notadmin

Join the MESA+ Institute at the University of Twente and contribute to groundbreaking research on nanometer-thin film multilayers. This PhD position focuses on hybrid X-ray metrology for accurate interface and structure analysis, with direct applications in optics, semiconductors, and nano-enabled devices.


🔍 Job Details

Title PhD Position – Multilayer Growth Optimization by Hybrid X-Ray Metrology (MOXY)
Organization/Publisher University of Twente – MESA+ Institute
Work Location Drienerlolaan 5, 7522 NB, Enschede, Netherlands
Research Field Nanotechnology, Solid-State Physics, Materials Science
Funding Info Fully funded, 4-year program
Application Deadline 16 September 2025
Posted Date 23 June 2025
Country Netherlands
Researcher Profile Early-stage researcher (PhD)
Required Qualification Master’s degree in Solid-State Physics, Materials Science, or related
Required Experience Thin-film deposition/metrology, Matlab or Python data analysis
Salary Details €2,901 – €3,707/month (plus allowances & benefits)
Apply Button Apply Here

Nanometer-thin films are essential building blocks in advanced technologies, from photovoltaics to high-precision optical coatings and nanoelectronics. However, their ultra-thin structure—often only a few nanometers—makes precise characterization extremely challenging.

This PhD position at the University of Twente aims to address this challenge through hybrid X-ray metrology, enabling non-destructive, high-precision analysis of multilayer structures. By combining complementary techniques, this approach will “break the nanometric barrier” in structural analysis, delivering insights into interface roughness, interdiffusion zones, and compound formation within multilayers.

As a PhD researcher, you will:

  • Develop an in-house X-ray metrology platform for optical contrast and interface analysis.

  • Quantify interface morphology, interdiffusion zones, and barrier layer effects.

  • Design and fabricate custom multilayer structures for experimental testing.

  • Apply X-ray reflectometry and other surface science techniques for in-depth analysis.

  • Correlate structural properties with performance across various wavelengths.

The research will be conducted in collaboration with an industrial partner under the Industrial Focus Group XUV Optics. The MESA+ Institute—one of the largest nanotechnology research institutes globally—provides world-class cleanroom facilities (1,250 m²) and state-of-the-art nano-characterization tools.

Why this matters: This work sits at the forefront of nanoscience, enabling the next generation of precision optics, semiconductor devices, and nano-engineered coatings.


🔗 Reference Links


⚠️ Disclaimer

This blog post is for informational purposes only. For full eligibility requirements, application procedures, and official details, please refer to the University of Twente’s official job listing.


📥 Apply Now

Click here to apply via the official University of Twente portal

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