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The Tyndall National Institute, in partnership with Bruker, is hosting a three-day Industrial Hands-On AFM Training from 30th March – 1st April 2026. This exclusive event offers researchers and engineers a practical deep dive into Atomic Force Microscopy (AFM), emphasizing nanoscale imaging and measurement for materials and semiconductor research.
🔍 Training Details
| Title | Industry Hands-On AFM Training 2026 |
|---|---|
| Organizer | Tyndall National Institute & Bruker |
| Location | Cork, Ireland |
| Focus Area | Atomic Force Microscopy (AFM), Nanoscale Characterization, Semiconductor Research |
| Duration | 3 Days (30th March – 1st April 2026) |
| Target Participants | Researchers, PhD Students, Engineers in Nanotechnology, Materials Science, and Semiconductor Fields |
| Event Type | Industrial Workshop & Live Demonstration |
| Application Status | Open |
| Official Links | Apply Here / INFRACHIP Training Portal |
| Country | Ireland |
🧩 Detailed Overview
About the Workshop
The Industry Hands-On AFM Training is designed to bridge the gap between nanoscience research and real-world semiconductor applications. Hosted at the Tyndall National Institute, one of Europe’s premier research centers in electronics and photonics, this program is developed in collaboration with Bruker, a global leader in nanoscale measurement instrumentation.
Building upon the success of previous workshops, this 2026 edition introduces a new introductory hands-on day, empowering participants to gain a complete understanding of Atomic Force Microscopy—from basic operation to advanced imaging techniques used in nanoelectronics, thin-film metrology, and material surface characterization.
What You’ll Learn
🔬 Core Learning Modules:
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Introduction to AFM principles and imaging modes
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Live demonstrations using the Bruker Dimension Icon AFM
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Understanding nanoscale surface topography and mechanical properties
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Application sessions linking AFM to semiconductor process analysis
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Real-world data interpretation and troubleshooting sessions
Who Should Attend
This workshop is ideal for:
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Nanotechnology and semiconductor researchers
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Postgraduate students exploring surface science and device characterization
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Industry professionals seeking to implement AFM-based metrology in R&D workflows
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Academics interested in AFM as a teaching and analytical tool
Why This Matters for Nanotechnology
AFM is one of the most powerful nanoscale imaging tools—enabling scientists to visualize, measure, and manipulate structures at atomic precision.
This workshop provides direct exposure to nanomechanical property mapping, thin-film morphology analysis, and surface roughness studies, which are critical in:
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Nanoelectronics device fabrication
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Semiconductor wafer inspection
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MEMS/NEMS research
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Advanced materials design
Benefits & Networking Opportunities
🌟 Gain hands-on experience with industrial-grade AFM
🤝 Network with nanotechnology researchers and Bruker experts
📈 Enhance your understanding of nanoscale metrology techniques
🎓 Receive participation certification from Tyndall National Institute
Application Instructions
Interested candidates can apply directly through the INFRACHIP portal or the official event page.
📅 Event Dates: 30th March – 1st April 2026
📍 Venue: Tyndall National Institute, Cork, Ireland
🔗 Apply Now: https://infrachip.eu/training/
Reference Links
Disclaimer
All event details are based on publicly available information as of October 2025. Please verify updates on the official Tyndall or INFRACHIP websites before applying.
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